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Rick's Blog

Big data presents significant challenges related to data curation, database evolution, distributed computing, security, and scalability, as I’ve noted in several recent posts. Yet another challenge relates to user interfaces, according to MIT Professor David Karger in the online course “Tackling the Challenges of Big Data,” which runs through March 17. Hal Varian, Karger said, has pointed out that as data becomes more pervasive, it becomes more important to be able to understand it, process it, visualize it, and communicate it to others. Computers can handle the processing part (as...
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Jack Ganssle is an internationally recognized embedded systems engineer, author, and speaker. He has published more than 700 articles on different aspects of embedded...

Big data, defined as an all-encompassing term for any collection of data sets so large or complex that it becomes difficult to process using...

When I think about the places I’ve worked, my strongest memories center on the people. They fill, or have filled, important roles in my...

by Rick Nelson, Executive Editor Effective PCB and subsystem quality depends on in-circuit, functional, and embedded test plus inspection. In the aftermath of electronica 2014...

If you and I need to communicate sensitive information to each other, we can encrypt it. Using one of the asymmetric public key methods,...

The newly approved IEEE 1687 standard—Internal JTAG, or simply IJTAG—is changing the way tools companies like ours think about interoperability. For example, IJTAG interoperability...

Special Reports

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Accurately measuring very low-level signals requires more than just good instrumentation. Special care is needed throughout the measurement system because the very small size...
Special Report - EMC Test

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The run-up to the EMC Symposium, scheduled for March 15-20 in Santa Clara, puts the test-and-measurement industry’s focus on solving the puzzle of electromagnetic...

MAGAZINE - MARCH EDITION

This year is shaping up to be an active one for Ethernet as the industry builds on innovations that occurred in 2014. The University...

Interconnect technology has a key role to play in test-and-measurement applications, whether you need to make a few connections on a benchtop or many...

The Automotive Testing Expo held in Novi, MI, last fall provided an opportunity to investigate the design and test of an array of components...

As standards develop and evolve, engineers need flexibility to keep pace as their designs progress and test-equipment requirements change. Software has a key role...

Over the years, many writers have implied that statistics can provide almost any result that is convenient at the time. Of course, honest practitioners...

Electrical engineering might be traced back over 2,600 years to Thales of Miletus, who noted that rubbing fur on amber would cause an attraction...

Scope Enhancements Enhancements to the R&S oscilloscope portfolio include new models, applications, and accessories. Among the enhancements is a high-definition mode that increases the vertical...

Accurately measuring very low-level signals requires more than just good instrumentation. Special care is needed throughout the measurement system because the very small size...
Special Report - EMC Test

The run-up to the EMC Symposium, scheduled for March 15-20 in Santa Clara, puts the test-and-measurement industry’s focus on solving the puzzle of electromagnetic...

WHITE PAPER

While LTE-Advanced brings the promise of higher data rates, designing devices for use in LTE-A offer new test challenges....


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