Features

Manager’s Forum
Creating a Mission to Drive Business Objectives

Aerospace/Defense Test
Overcoming the Legacy Equipment Replacement Blues

Wireless Test
Mobility Testing for Beamforming Base Stations

Power Supplies/Sources
Empowering DC Supplies and AC Sources

Vibration Test
Octave Analysis Explored

EMC Symposium
Detroit Plays Host to 2008 EMC Symposium


Upcoming Events

AUTOTESTCON
Salt Lake City, UT
September 8-11, 2008

EMC By Your Design -
A Practical Applications Seminar and Workshop

Northbook, IL
October 2-3 and 6-7, 2008

Automotive Testing Expo
Novi, MI
October 22-24, 2008

International Test Conference
Santa Clara, CA
October 28-30, 2008

More Upcoming Events...

 

FLIR - Thermal Imaging

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Paul's Picks
Paul Milo

Mixed-Signal Tester Supports 30-A Capability
Advantest America

USB Modular Instruments Address Functional Test
Agilent Technologies

Scopes Integrate Deep Toolbox and Fast Throughput
LeCroy

Test Manager Added to AC Test Software
Pacific Power Source

Low-Consumption Supplies Feature Remote Sensing Input
Protek Test and Measurement

Spectrum Analyzer With GPS Shows Live RF Views
Tektronix

Toolset Reduces Debug Time for Complex SOC Devices
Verigy


Search Evaluation Engineering

White Papers

Ethernet I/O Chassis—A VME Alternative
This white paper describes reasons the Ethernet I/O chassis can be an alternative to aging VME systems and why Flight Safety International switched from VME to UEI’s Gigabit Ethernet RACKtangle™ I/O chassis.

Orthogonal Frequency Division Multiplexing
Orthogonal frequency division multiplexing (OFDM) is a form of digital modulation used in a wide array of communications systems. This paper will explain what OFDM is, why it’s important, where it’s used, and what test instrumentation is required to maintain it.

The Future of In-Circuit Testing in the High-Speed, Complex Electronics Environment
As board complexity and node counts continue to rise and high-speed differential signaling to grow in popularity, in-circuit test needs to move quickly beyond the traditional realms.

PCI Express Performance Measurements
Performance always depends on the efficiency of both devices on a PCI Express link. Parameters like payload size, flow control credit availability, and different latencies strongly influence the overall result.

A Comparison of Methods for Estimating Total Jitter Concerning Precision, Accuracy and Robustness
An evaluation using spectral and statistical techniques provides results for both real and simulated measurement scenarios and insight into the weaknesses and strengths of the various methods.

More White Papers...

 

Sponsors
INSTRUMENTATION
Acopian Power Supplies
Agilent Technologies
U8000 Series Supplies
U1240A Series DMM
 
Associated Power Technology
Avtech Electrosystems
Crystal Instruments
Instek America
Keithley Instruments
Kepco
Kikusui America
TOS8830/8040/8030 Hipot Testers
PLZ6000R DC Load
 
Pacific Power Source
Programmed Test Sources
Protek Test and Measurement
Stanford Research Systems
 
DATA ACQUISITION
Agilent Technologies
Omega Engineering
United Electronic Industries
 
PC TEST
National Instruments
Pico Technology
 
ATE
Aries Electronics
CheckSum
Chroma Systems Solutions
Universal Switching
 
COMMUNICATIONS TEST
Rohde & Schwarz
Boonton
 
ENVIRONMENTAL TEST
LDS Test and Measurement
Micro Control
Vibration Test Systems
EMC
A H Systems
AR Worldwide
RF/EMC Test Amplifiers
Orange Book of Knowledge
 
Curtis Industries
Elite Electronic Engineering
HV Technologies
Leader Tech
Master Bond
Oak-Mitsui Technologies
Ophir RF
Parker/Chomerics
Ramsey Electronics
Spira Manufacturing
Tech-Etch
EMI Shielding Solutions
EMI/RFI Shielding Catalog
 
Teseq
Tusonix
 
SOFTWARE
LeCroy
National Instruments
 
ESD
Lista International
 
August Articles
For More Information
Aerospace/Defense Test
Agilent N8200A
ATML Instrument Description
EADS 3171
Geotest GP1552W
Giga-tronics Replacement Card
Tabor Pulse Master Series
Teradyne Bi-41x
WinSoft WISE Emulator