A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz

Cmt Vertical Rgb Dark TextThis paper presents a new measurement method based on the parallel plate capacitor concept, which determines complex permittivity of dielectric sheets and films with thicknesses up to 3 mm. This new method uses a greatly simplified calibration procedure and is capable of measuring frequencies up to 6 GHz.