Jul 3rd, 2014
Using LXI Advanced Triggering Methods to Reduce ATE Test Times
Automatic test equipment (ATE) systems are widely used across a range of industries including manufacturing, avionics, aerospace, military and defense, particularly because of their efficiency. When multiple test instruments are required to work in conjunction with one another the ATE architecture can become very complex and difficult to design. This white paper will discuss a few of the popular methods for programming test sequences and how a test developer can take advantage of VTI’s EX1200 series, which implements LXI extended functions, to make test systems operate more efficiently.