Teradyne announces the UltraSerial60G for semiconductor chip testing
NORTH READING, MA—Automated test solutions supplier Teradyne, Inc. has announced the release of the UltraSerial60G, which has the ability to test 60Gbps serial interfaces in 5G, automotive, and networking.
The UltraSerial60G is an addition to Teradyne’s UltraFLEX platform and expands the platform’s capabilities, enabling customers to test their device at the target data rate in the device’s mission mode to ensure it meets the most demanding standards.
The UltraSerial60G simplifies design-for-test processes and shortens new device bring up time. The solution features leading high test parallelism with support for both NRZ and PAM4 serial communications protocols.
“The UltraFLEX platform continues to evolve to pioneer new capabilities and keep pace with our customers’ needs,” said Yi Zhang, Product Marketing Manager at Teradyne. “Our support for PAM4 is especially important for the industry as many vendors are utilizing it for the next several generations of high-speed interfaces.”
The UltraSerial60G instrument contains 32 differential transmitters and 32 differential receivers that can generate and measure NRZ data at up to 32Gbps and PAM4 data at up to 60 Gbps. Each differential receiver has a 25GHz bandwidth digitizer that allows bench-top test quality with no additional DIB circuitry. The instrument also features a bits-to-RF test capability in a single insertion for the next generation 5G RF devices.
The UltraSerial60G is supported by ATE test software IG-XL for rapid program development.
The UltraSerial60G instrument is now available for customer orders.