September 23, 2013. Tektronix is mounting an aggressive effort to leverage its electrical and optical test expertise. On the electrical front, it is introducing its multi-function 32G-bps linear equalizers; enhancements to multi-channel BERTs for receiver test; and will release automated compliance test suite for CEI-28G-VSR transmitter test. On the optical front, new offerings provide enhanced capability for testing both optical network components and next generation coherent modulation formats.
The introductions include the LE320, a 2-differential-channel, 9-tap linear equalizer supporting data rates up to 32 Gb/s as part of a BERTScope receiver test system; new options for the PPG/PED multi-channel BERTs that provide signal impairments and output adjustment at data rates up to 32Gbps, as well as a new 40Gbps error detector model; and Option CEI-VSR that automates the DSA8300 Sampling Oscilloscope to perform required compliance tests for the CEI-28G-VSRstandard.
The need for 4x25G testing is becoming more important as the industry moves from silicon design to transceiver and system design. Designers are creating innovative network elements that allow up to 100 Gb/s, which will be delivered using four lanes of 25-28 Gb/s. Design challenges emerge when transmitting these high frequencies on printed circuit boards, even for short distances. The LE320 provides test engineers with versatile output signal conditioning and tunable input equalization to create an optimal system for testing four electrical channels operating at 25-28 Gbps each; an ideal complement to the multi-channel capabilities of the enhanced line of PPG/PED pattern generator and error detector products. The Sampling Oscilloscope Option CEI-VSR will ensure efficient and consistent compliance testing support so that design teams can smooth the transition to manufacturing.
“As 100G moves into the mainstream, we are providing two critical additions to our portfolio that address challenges in 4x25G electrical PHY testing for chips, gearboxes, transceivers and systems,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. “For receiver testing we’ve enhanced our BERTScope with support for electronic channel modeling and equalization while adding 40 Gbps support to our multi-channel BERT. And for transmitter electrical testing we are providing designers with an automated solution for CEI-28G-VSR.”
Compact and Versatile 32 Gb/sec Linear Equalizers for Rx Testing
Designers developing systems that run at 10 Gb/s or faster need an equalizer in front of Rx inputs or a pre-emphasis module on transmitter Tx outputs. As speeds increase, designers have had a limited selection of instrument-grade signal conditioning products beyond 12 Gb/s for meeting these requirements. The LE320 will support signal conditioning on data rates from 8 Gb/s to 32 Gb/s in a 9-tap design used to deliver the high-precision error rate testing required by 100G communication standards like CEI-28G-VSR. The remote head design of the LE320 enables designers to minimize cable length in their test system and avoid signal degradation issues which are significant at 25 to 28 Gb/s. Based on custom microwave silicon from Hittite to reduce component count, the new LE320 delivers performance and versatility in an instrument-grade package not much larger than a smartphone at prices of less than one-third that of less capable alternatives.
With instrument-grade programmable equalization, the LE320 can be configured to provide standards specific equalization, permitting bit error rate (BER) analysis on otherwise closed eye signals. For customers working with lower data rates, Tektronix will also offer an LE160 model for systems up to 20Gbps for such applications as 40G-KR4, 14Gbps Fibre-channel and 16GbpsPCI Express 4.0.
Multi-lane, high data rate standards are driving the need for multi-channel Bit Error Rate instruments. Stressed receiver tests, four-channel end-to-end BER testing, and crosstalk tests are now among of the suite of tests driven by the move to multiple high-speed parallel lanes.
The Tektronix PPG/PED line of multi-lane BERTs has now been enhanced to provide expanded jitter impairment capability, new output adjustment flexibility and higher speed error detection capability to better meet the requirement of these standards.
The extended range of jitter insertion options includes option HFJIT which now provides BUJ as well as RJ and SJ; and high amplitude/low-frequency PJ as part of new option LFJIT. Also introduced is option ADJ which adds adjustable outputs with fast rise/fall time and low intrinsic jitter required for 32 Gb/s multi-channel pattern generator applications. Data rate margin testing has been enhanced with the introduction of the new PED4000 series of error detector products capable of data rate of up to 40 Gbps, in 1 or 2-channel configurations.
The Implementation Agreement for Optical Internetworking Forum Common Electrical Interface (OIF CEI) 3.0 specifies the tests and limits for devices based on OIF standards. CEI-28G-VSR is one of those standards and is intended for use in very short-reach electrical channels in pluggable optical transceivers. It is critical that these electrical interfaces are able to meet system bit error rate (BER) targets and must undergo rigorous testing and debug cycles.
Until now, performing all the required tests for CEI-28G-VSR compliance and isolating problems related to jitter or noise has been difficult and labor intensive. Integration with Tektronix 80SJNB serial data link analysis software enables deeper debug and timing root cause analysis without the need to move to a different instrument or measurement setup.
By using Option CEI-VSR with their Tektronix DSA8300 Sampling oscilloscope, design engineers can perform compliance measurements in less than 5 minutes, reducing their testing time by approximately 95 percent compared to manual alternatives. In addition, Option CEI-VSR can be used to determine the optimal value for CTLE peaking as required by the CEI-28G-VSR Host-to-Module interface specification. The best CTLE filter is chosen from a given set of filters and used to perform the measurement. Without this capability, design engineers would need to devote time to manually determining the optimal CTLE value, decreasing productivity.
Tektronix 32-Gb/s LE320 and 16-Gb/s LE160 linear equalizers are available for customer evaluation now with worldwide availability starting in Q4. Prices start at $23,000 US MSRP. Tektronix PPG3000 Options for Jitter Insertion start at $13,800, and new PED4000 series begins at $102,000. The introductions include the LE320, a 2-differential channel, 9 tap Linear Equalizer supporting data rates up to 32 Gb/s as part of a BERTScope receiver test system; new options for the PPG/PED multi-channel BERTs that provide signal impairments and output adjustment at data rates up to 32 Gbps, as well as a new 40-Gbps error detector model; and Option CEI-VSR that automates the DSA8300 Sampling Oscilloscope to perform required compliance tests for the CEI-28G-VSR standard.
Optical Network Testing
Tektronix also today announced expanded testing support for both short range and long-haul 100G optical network testing. Debuting at the European Conference on Optical Communications September 23-26 in London are the 80C15 32GHz Multi-Mode Optical Sampling Module and the OM5110 46GBaud Multi-format Optical Transmitter, giving customers enhanced capability to test silicon photonic components, network elements and systems as well as the coherent modulation formats used in next generation optical fiber networks.
These introductions reflect the changing dynamics in the optical networking design and manufacturing market. High-speed optical networking is increasingly being used for short-reach data-center applications creating a need for test equipment to support analysis of multimode, 850 and 1,310nm signals found in 100Gb (4×25) Ethernet systems. For long-haul applications, designers are turning to coherent modulation techniques to get the most from available fiber bandwidth, creating a need for test systems to help ensure optimum performance and low bit error rates using formats such as PM-QPSK, PM-16QAM.
“With the 80C15, Tektronix is responding to market needs for a highly accurate multimode short-reach testing solution that can be used both in the lab and production environments,” said Reich. “And to address the strong demand for more efficient long haul transmission over existing fiber, an instrument-grade optical transmitter such as the OM5110 will help researchers and designers gain a deeper understanding of coherent optical modulation methods.”
The new 32 GHz 80C15 multi-mode optical sampling module for use with DSA8300 Series Sampling Oscilloscopes provides high-fidelity acquisition of 850 and 1,310 multi-mode signals. With a tightly controlled frequency response, it enables repeatable automated compliance testing for all of the short reach standards from 22 to 32 GHz.
The combination of a DSA8300 series mainframe and an 80C15 Multi-Mode Optical Sampling Module deliver ultra-low instrumentation noise and phase noise (jitter) for <100 fs RMS electrical and optical jitter measurements. It delivers the test margin needed to accurately measure the low power signals used in short reach applications. It also supports mask testing including mask margins based on standard specified hit ratios.
For long-haul optical research and development applications, the OM5110 modulates all common formats including BPSK, PM- QPSK, and PM-16QAM up to 46GBaud with both fully automated and manual bias control of modulator and RF amplifiers giving users complete configurability and versatility. With the introduction of the OM5110, Tektronix becomes the only test and measurement vendor that can offer a complete coherent optical test system from signal generation, to modulation, acquisition, and analysis.
The OM5110 offers built-in C or L band lasers along with support for external lasers. Automatic bias control allows for quick setup and easy operation of the modulator while the manual bias control capability gives users the ability to take control of all bias voltages for testing specific scenarios. Included software provides control of all operating parameters via Ethernet, including laser power and bias control.
The OM5110, together with the AWG70001A 50GS/s Arbitrary Waveform Generator, comprise a complete coherent optical signal generation system which is ideal for design of the most effective coherent modulation formats. By adding an optical modulation analyzer and oscilloscope, such as the OM4106D Coherent Lightwave Signal Analyzer and DPO73304DX Digital Phosphor Oscilloscope, customers have access to a complete, end-to-end coherent optical test system.
The 80C15 will be available in early 2014 with prices starting at $55,000 US MSRP. The OM5110 will be available by the end of 2013 with prices starting at $120,000 US MSRP.