Critical test issues up for debate at Test Vision 2020

June 8, 2014. Test professionals who want to learn, forecast, and debate the future of semiconductor test can attend the 7th annual IEEE Test Vision 2020 Workshop, held in conjunction with SEMICON West 2014 (July 8-10) in San Francisco. The event will feature speakers from Qualcomm, Gartner, AMD, GLOBALFOUNDRIES, and Mentor Graphics, along with speakers from key semiconductor test industry suppliers.

Organized by SEMI and sponsored by the IEEE Instrumentation and Measurement Society, Test Vision 2020 (July 9-10), is a two-time winner of the ATE Test Technology Technical Council’s “Most Successful Event” Award. Test Vision 2020 serves as a platform where foundries, IDMs, and fabless companies discuss their critical test requirements with leading test equipment and solution providers. Attendees include semiconductor test engineers, product engineers, test managers, product managers, test equipment users, developers, and industry analysts.

Test Vision 2020 will convene a first-class gathering of thought leaders, users, and suppliers of test IP and equipment. The Internet of Things (IoT) will dominate the discussion, as the mainstreaming of “connected devices” creates challenges unique to test and test assumptions. The Test Vision 2020 workshop will feature industry speakers, poster sessions, presentations, and participation from semiconductor test industry leaders.

Michael Campbell, senior VP at Qualcomm Technology, will offer a presentation titled “Testing the THINGS of the Internet of Things,” and Dean Freeman, research VP at Gartner Research, will present on “How the IoT will Impact the Semiconductor Industry.”

A panel discussion will center on “The Pros and Cons of DiY Tester Development,” with Ken Lanier from Teradyne moderating panelists from Advantest, Altera, Amkor, KYEC, National Instruments, and Texas Instruments.

Sessions include “IoT Test & Quality,” with presenters from AMD, Mentor Graphics, and Teradyne; “2.5D/3D Probe & Test,” with speakers from GLOBALFOUNDRIES and FormFactor; and “Big Data,” with presenters from Roos Instruments, Galaxy Semiconductor, and AMD.

The workshop will also include “Distinguished Guest Lecturers on IoT-related Topics,” with speakers from Asset InterTech, Xcerra, and Cascade Microtech. There will also be a reception with poster session.

www.semiconwest.org/SessionsEvents/Test

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