Workshop on Accelerated Stress Testing and Reliability
The 14th Workshop on Accelerated Stress Testing and Reliability (ASTR) will be held Oct. 1- 3 in Portland, OR.
The purpose of the ASTR Workshop is to share ideas on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electromechanical hardware that would result in failures during use. These techniques are focused on testing electronic hardware to destruction limits and root cause investigation to determine the physics of failure. The goal of accelerated stress testing is to produce mature products at market introduction and, in making it robust, the product can be screened for manufacturing defects with high levels of combined stresses (beyond end-use specifications) for shorter lengths of time.
For complete workshop details and registration information, please visit
http://www.ewh.ieee.org/soc/cpmt/tc7/ast2008/
The ASTR Workshop is sponsored by the IEEE Components, Packaging, and Manufacturing Technology (CPMT) Society. CPMT is an international forum for scientists and engineers engaged in the research, design, and development of revolutionary advances in microsystems packaging and manufacture.
The IEEE is the world's largest technical professional association, with more than 377,000 members in more than 150 countries. Through its members, the IEEE is a leading authority on areas ranging from aerospace, computers, and telecommunications to biomedicine, electric power, and consumer electronics. Additional information about the IEEE can be found at
http://www.ieee.org/.