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"Online Exclusives"


Board test in a repair depot: bridging past and future

By Luca Corli, Worldwide Sales Manager, Seica SpA on August, 2014 [0]
If you're used to a manufacturing environment, board test in a repair depot will look very different.
Other Tags:  ATE 

Characterizing Leakage Current of High-Voltage Semiconductor Devices

By Jennifer Cheney, Keithley Instruments on December, 2013 [201400]
Using an SMU with a high-voltage power supply provides a device test system with good low-level current accuracy and an accurate current limit.
Other Tags:  Instrumentation 

The Year in EMC: from Components to a Congressman's Visit

By Rick Nelson on July, 2014 [0]
The run-up to the EMC Symposium provides an opportunity to review EMC news over the past year. Recent news ranges from a congressman's visit to an EMC facility to the introduction of feed-through filters
Other Tags:  Instrumentation 

Five Myths of Modular Instruments

By Tom Lillig, Agilent Technologies on July, 2014 [0]
As modular test equipment continues to grow in popularity, so have the abundance of myths surrounding advantages and disadvantages of modular vs. traditional “box” instruments.
Other Tags:  LXI/PXI/VXI 

Testing two birds with one stone

By Steve Pateras, Mentor Graphics on June, 2014 [201406]
The proliferation of semiconductor into safety-critical applications such as automotive and medical opens a new can of worms for test.
Other Tags:  Software 

Vendors elaborate on LTE-A test

By Rick Nelson, Executive Editor on May, 2014 [0]
Since our May print edition, which includes a report on LTE, went to press, vendors have introduced new products or enhancements that address LTE test.
Other Tags:  Instrumentation 

Vendors expand on remote monitoring

By Rick Nelson on May, 2014 [0]
Sensors monitor everything, according to a special report in EE's June print edition. Companies including Agilent, HBM, and National Instruments offer elaboration on the topic in a Web-exclusive complement to the June print report.
Other Tags:  Instrumentation 

Transitioning from Design Validation to Production Test

By Skip Davis, Applicos NA on April, 2014 [0]
The need to correlate design and production test results can be supported by using a modular approach to mixed-signal testing.
Other Tags:  Key Technologies 

Serial Bus Decoding and Applications

By Tom Lecklider, Senior Technical Editor on April, 2014 [0]
Although most digital scopes offer serial bus decoding and/or triggering functions, the capabilities and buses addressed vary widely.
Other Tags:  Instrumentation 

Elaborating on the design, prototyping, and test of radar

By Rick Nelson on March, 2014 [0]
Experts elaborate on radar test issues relating to software, design, prototyping, spectrum crowding, modularity, pulse measurements, simulation, AESA, and slow-moving targets.
Other Tags:  Instrumentation 

Staying in the Zone

By Tom Lecklider, Senior Technical Editor on March, 2014 [0]
An optimally designed anti-alias filter is key to accurate data acquisition.
Other Tags:  Instrumentation 

Fix the Process, Not Just the Product

By Mary Elmallakh, M. Sc., and Paul Groome, Digitaltest; and Andy Shelton, Pulse Communications on February, 2014 [0]
Quality management solutions integrate real-time test and inspection with engineering and production data to optimize the manufacturing process.
Other Tags:  Instrumentation 

Modular instruments make waves at DesignCon

By Rick Nelson on February, 2014 [0]
Agilent and NI demonstrated AXIe BERT and PXI LTE power-amplifier envelope-tracking test, while Pickering Interfaces highlighted its PXI and LXI switch products.
Other Tags:  Instrumentation 

LXI Data-Acquisition System for Wind Tunnel Testing

By Fred Bloennigen, Ph.D., LXI Consortium on February, 2014 [0]
LXI-based function cards provide 96 channels of 24-bit pressure data plus remote access for a wind tunnel monitoring application.
Other Tags:  Instrumentation 

Test Innovations for ISO 26262

By Steve Pateras, Mentor Graphics Silicon Test Solutions on January, 2014 [0]
Automotive safety features are experiencing large growth, and the move toward autonomous vehicles promises to even further increase the number.
Other Tags:  ATE 

UFS PHY and Protocol Testing for Compliance

By Chris Loberg, Tektronix on January, 2014 [0]
With all the momentum behind universal flash storage from JEDEC with the recent publication of JESD224, the message is clear—UFS is here to stay.
Other Tags:  Communications Test 

Vendors Elaborate on HSIO Test Products and Strategies

By Rick Nelson on January, 2014 [0]
Print and online reports highlight oscilloscopes and other instruments that tackle high-speed serial-I/O communications test.
Other Tags:  Communications Test 

Scope Triggering at the Sample Level

By Tom Lecklider, Senior Technical Editor on December, 2013 [0]
A high sample rate-to-bandwidth ratio and a conservatively set threshold make digital triggering relatively straightforward.
Other Tags: None.

Path to Widespread Adaptive Test Revealed at CAST Workshop

By Tom Morrow, chief marketing officer, SEMI on November, 2013 [0]
Adaptive test has been identified as the most essential test process and methodology change needed to achieve lower test costs by the latest release of the ITRS.
Other Tags:  Software 

Vendors Leverage FPGAs, SoCs to Speed Test

By Rick Nelson, Executive Editor on October, 2013 [0]
Advanced semiconductors present test challenges, but test vendors can leverage advanced semiconductor technology.
Other Tags:  LXI/PXI/VXI 

Synthetic instruments make inroads with RF applications

By Tom Lecklider on September, 2013 [0]
Are we there yet with synthetic instruments? Autotestcon panelists answer yes, no, and maybe.
Other Tags:  ATE 

Sessions address modular instruments at Autotestcon

By Tom Lecklider on September, 2013 [0]
Two Autotestcon sessions focused on modular instruments: one covered AXIe, LXI, PXI, and VXI, and the other offered AXIe architecture details.
Other Tags:  LXI/PXI/VXI 

Vendors help customers meet modular-instrument challenges

By Rick Nelson on September, 2013 [0]
Modular instruments in general and PXI implementations in particular present significant flexibility in configuring ATE systems.
Other Tags:  LXI/PXI/VXI 

Future Memory Technology for the Terabit Era

By Jan Van Houdt on August, 2013 [0]
At the imec technology forum held July 8 in San Francisco in conjunction with SEMICON West, Jan Van Houdt, director of the flash memory program, discussed emerging memory technologies. Here, he provides a brief summary of his presentation.
Other Tags:  Key Technologies 

EMC Symposium Highlights Technology, Instruments, and Software

By Tom Lecklider on August, 2013 [0]
EMC 2013 offered technical sessions and product highlights. Sessions covered topics ranging from spectrum analysis to antennas, while on the exhibit floor vendors highlighted products ranging from simulation software to EMI test receivers.
Other Tags:  Instrumentation 

Visibility boosts design and test

By Rick Nelson on July, 2013 [0]
When it comes to the design and test of hardware and software, it's all about visibility, according to Glenn Woppman, president and CEO of ASSET InterTech.
Other Tags:  ATE 

TÜV Rheinland addresses energy issues, export opportunities

By Rick Nelson, Executive Editor on June, 2013 [0]
TÜV Rheinland was founded in 1872 to inspect pressure vessels in the districts of Elberfeld and Barmen, Germany. Today, the TÜV has expanded into a worldwide organization that employs about 17,000 people in 500 locations in 65 countries and generates annual revenues of €2 billion.
Other Tags:  Inspection 

IMS highlights microwave products and technologies

By Tom Lecklider, Senior Technical Editor on June, 2013 [0]
Senior Technical Editor Tom Lecklider traveled to the International Microwave Symposium in Seattle last week and filed this report on the papers he attended and exhibits he visited.
Other Tags:  Instrumentation 

Workshop coverage extends from software to ATE gesture interfaces

By Rick Nelson, Executive Editor on June, 2013 [0]
Test Vision 2020 will cover a range of topics, from a voice/gesture ATE interface to the role of software, according to Ajay Khoche, general chair, and Pete Hodakievic, program chair.
Other Tags:  Software 

Wireless Test Highlighted at CTIA 2013

By Rick Nelson, Executive Editor on May, 2013 [0]
CTIA 2013 has provided an opportunity for companies including Azimuth Systems, Aeroflex, and Rohde & Schwarz to highlight new products and capabilities.
Other Tags:  Instrumentation 

Moore's Law Drives Data Acquisition

By Rick Nelson, Executive Editor on April, 2013 [0]
Moore's law has driven data-acquisition advances to yield systems like NI CompactDAQ and NI CompactRIO, HBM's QuantumX CX22W, Yokogawa's WE7000, and Graphtec's GL900.
Other Tags:  Automotive/Vehicle Test 

Big Data Comes to Semiconductor Test

By Tom Morrow, vice president, SEMI on April, 2013 [0]
While the term "big data" originated in the IT world and the Web for storing and analyzing large distributed aggregations of loosely structured data, it is now becoming a critical issue in the future of semiconductor test.
Other Tags:  Software 

Modularity protects investment in MIL/aero test applications

By Rick Nelson, Executive Editor, on March, 2013 [0]
Representatives of Agilent, Giga-tronics, National Instruments, and VTI Instruments discuss investment protection in mil/aero test applications.
Other Tags:  LXI/PXI/VXI 

Design and test links help support multistandard radios from design to production

By Rick Nelson, Executive Editor on February, 2013 [0]
Industry experts elaborate on hardware and software tools for multistandard radio lifecycle test from the R&D stage through manufacturing and field service.
Other Tags:  Instrumentation 

Nonintrusive Test Complements ATE to Meet PCB Test Needs

By Rick Nelson, Executive Editor on January, 2013 [0]
Experts comment on PCB test techniques including ICT, FCT, vectorless test, and nonintrusive boundary-scan-based techniques.
Other Tags:  Software 

LXI Positioned for Challenging Applications

By Tom Sarfi, LXI Consortium on January, 2013 [0]
LXI is the standard for Ethernet control of intelligent instrumentation, offering core features and extended functions.
Other Tags:  Instrumentation 

Software Helps Address Signal Integrity Challenges for Serial-Bus Test

By Rick Nelson, Executive Editor on January, 2013 [0]
Industry experts elaborate on pre-emphasis, software tools, and the signal-integrity challenge for high-speed serial-bus test.
Other Tags:  Software 

Anritsu looks to eliminate "hoist and hope" with portable instruments

By Rick Nelson, Executive Editor on December, 2012 [0]
Anritsu expanding its lines of portable instruments with the PIM Master MW82119A and the Spectrum Master MS2720T handheld spectrum analyzers.
Other Tags:  Instrumentation 

ITC topics extend from jitter measurement to board and system test

By Tom Lecklider, Senior Technical Editor on November, 2012 [0]
Panels, corporate presentations; sessions on jitter and phase noise, new-generation ATE, board and system test, and scan compression; and commentary on IJTAG were all highlights of ITC.
Other Tags:  Software 

Mild Hybridization Could Boost Automotive Efficiency

By Rick Nelson, Executive Editor on November, 2012 [0]
Micro and mild hybridization technologies hold promise for improving automotive efficiency, says Nick Pascoe, CEO of Controlled Power Technologies.
Other Tags:  Automotive/Vehicle Test 

Autotestcon Panelists Highlight Modular Instrumentation

By Tom Lecklider, Senior Technical Editor on September, 2012 [0]
Panelists representing Agilent, NI, VTI, Modular Methods, and industry consortia addressed modular-instrument strategies.
Other Tags:  Military / Aero Test 

NIWeek Highlights Energy and Education

By Tom Lecklider, Senior Technical Editor on August, 2012 [0]
An NIWeek Wednesday session afternoon highlighted LENR (Low Energy Nuclear Reaction), while Thursday's keynote focused on education.
Other Tags:  Software 

NIWeek: Software Boosts Vector Signal Transceiver

By Tom Lecklider, Senior Technical Editor on August, 2012 [0]
In keeping with NIWeek tradition, Jeff Kodosky, NI cofounder and business and technology fellow, kicked off Wednesday's keynote address.
Other Tags:  Instrumentation 

NIWeek: "We don't judge, we measure"

By Tom Lecklider, Senior Technical Editor on August, 2012 [0]
NIWeek 2012 has ushered in a revised use of the Austin Convention Center facilities to tell more than 3,400 attendees about graphical systems design..
Other Tags:  Instrumentation 

LabVIEW 2012 shares stage with vector signal transceiver

By Tom Lecklider, Senior Technical Editor on August, 2012 [0]
NI LabVIEW 2012 debuts at NIWeek along with a vector signal transceiver, which National Instruments calls the first truly "software designed instrument."
Other Tags:  Instrumentation 

New Breed of Semiconductors Demands New Breed of Semi Characterization and Test Solutions

By Lee Stauffer, Keithley Instruments Inc. on June, 2012 [0]
Lee Stauffer of Keithley Instruments looks at the test-and-measurement challenges posed by the high-voltage, high-current semiconductor devices that address energy efficiency.
Other Tags:  Instrumentation