Product Briefing

ATE

Probe Cards Measure DC and RF - Cascade Microtech (4/08)

Flexibility Differentiates New SMU and Switch Modules - National Instruments (4/08)

Wiring Analyzer Features Flash Disk Data Storage - CableTest Systems (2/08)

Concurrent In-Circuit Tester Combines Two Test Modules - Teradyne (2/08)

12-GHz Module Tests Muiltiport RF Devices - Advantest (12/07)

14-Slot Chassis Designed for Rugged Applications - ADLINK Technology (11/07)

Synthetic Test Environment Addresses LXI Platform - Aeroflex (11/07)

Communications Test

Prewritten Routines Streamline Wireless Test - Anritsu (4/08)

PIM Test System Makes On-Site Measurements - Boonton, a Wireless Telecom Group Company (4/08)

Test Solution Addresses MIPI D-PHY Interconnects - Agilent Technologies (3/08)

Small-Footprint Meter Powered Solely From USB Cable - National Instruments (3/08)

Mid-Range Spectrum Analyzers Show Live RF Signals - Tektronix (3/08)

Software Tools Automate SATA Gen-2 Testing - Tektronix (3/08)

Portable Spectrum Analyzer Includes Tracking Generator - B+K Precision (2/08)

Microwave Signal Generator Features 100-µs Switching Speed - Anritsu (1/08)

Portable Spectrum Analyzer Operates up to 7.5 GHz - Boonton, Wireless Telecom Group (1/08)

RF Test Solution Supports 4x4 MIMO Applications - Keithley Instruments (12/07)

PCIe 2.0 Design Tester Provides Cross-Bus Analysis - Tektronix (12/07)

RF Measurement Capability Available for SOC Platform - Verigy (12/07)

Vector Signal Generator Delivers 20-MHz Modulation Bandwidth - National Instruments (11/07)

Economy-Class Signal Analyzer Is Fast and LXI Compliant - Agilent Technologies (10/07)

Environmental Test

Temperature Forcing System Is Compact and Versatile - Thermonics (9/07)

Temperature Forcing System Is Self-Contained Unit - Thermonics (7/07)

Inspection

X-Ray System Provides 95% Fault Detection Rate - Agilent Technologies (6/07)

Instrumentation

Multiple Communications Ports Distinguish PXI Controllers - ADLINK Technology (4/08)

10 DSOs and MSOs Have Fastest Update Rate - Agilent Technologies (4/08)

DMM Redefines 6½-Digit Resolution - Signametrics (4/08)

Real-Time Scopes Acquire One Billion-Plus Samples - Agilent Technologies (3/08)

DDS-Based Generator Produces 20-MHz Waveforms - B+K Precision (3/08)

Pulse Function Arbitrary Noise Generator Minimizes Test Time - Agilent Technologies (2/08)

Scope/Digitizer Card Samples on Eight Channels With 2-GS Memory - Strategic Test (2/08)

1-GHz Scopes Address Design Validation - LeCroy (1/08)

Controllers Extend Multicore to PXI and PXI Express Systems - National Instruments (1/08)

Series Launches Pulse/Waveform Generator Combination - Tabor Electronics (1/08)

Expanded USB DAQ Family Configures Simple Waveforms - Agilent Technologies (1/08)

Dual-Display Meter Features Dedicated Setup Buttons - Fluke (12/07)

Platform Designed for Silicon Validation and Diagnostics - Teseda (12/07)

Thermocouple Instrument Guarantees ±0.01% Accuracy - Data Translation (11/07)

DMM Series Designed for Installation/Maintenance Testing - Agilent Technologies (10/07)

Data Acquisition

Customizable DAQ Card Streams to PC - Strategic Test (4/08)

1,000-V Isolation Creates 48 Separate Instruments - Data Translation (3/08)

PC-Based Test

PCIbus Generator Provides 250-MS/s Performance - Tabor Electronics (2/08)

Standards Module Developed for In-System Recertification - Geotest-Marvin Test Systems (11/07)

VXI Oscilloscopes Calculate 36+ Waveform Parameters - ZTEC Instruments (11/07)

Software

Software Release Improves In-System Programming - GOEPEL electronic (1/08)

Tool Advances Existing At-Speed Test Methods - Synopsys (1/08)

Upgraded Platform Facilitates Test System Development - Proligent (12/07)

Reporting/Automated Managing Functions Added to Test Suite - OptimalTest (12/07)

Platform Offers Effort-Saving Flexible System Frameworks - Agilent Technologies (11/07)

Graphical Test Software Developed for LXI Applications- Data Translation (9/07)