Hello, and welcome. You may have encountered me at my “Taking the Measure” blog at Test & Measurement World, where I am serving as editorial director through tomorrow, September 12. But after more than 13 years at Test & Measurement World, I have decided to move on, and on September 13, I'll be joining the editorial team at Evaluation Engineering.

My first official actions for EE will be to attend the Autotestcon show in Baltimore this week and the International Test Conference in Anaheim next week. I hope to see you at one or both of the shows. If you are not attending, look for me here or at http://www.evaluationengineering.com/

As for Test & Measurement World, it will continue to be in good hands, with Deborah Sargent and Martin Rowe continuing as managing editor and senior technical editor, respectively. The very capable and experienced Ron Wilson will be joining the editorial team, taking over my responsibilities as editorial director. I wish them well as I compete with them from my new vantage point.

(Origionally posted September 11 at http://rickeditor.blogspot.com/)




From T&MW to EE
Published since 1962, Evaluation Engineering has delivered in-depth technical information to the test engineering market for more than 50 years, serving engineers, engineering managers, and corporate managers responsible for test measurement and quality of electronic products and systems. EE is a multimedia resource providing a monthly magazine and digital edition, daily e-newsletters, product showcases, monthly special reports, trade show events, and a comprehensive website for buyers and specifiers of test equipment in semiconductors, medical, communication, RF, microwave, and wireless applications. An annual subscription is free to qualified test engineering professionals.