Toolset Reduces Debug Time for Complex SOC Devices
The Inovys Silicon Debug Solution is a suite of tools that addresses defect detection and diagnosis by mapping electrical failures to physical defects through logic bitmaps. It combines the Inovys FaultInsyte Software with the V93000 SOC Test System to find elusive faults while complex SOC devices are still on the tester.
The V93000 supports accurate data collection through its large fail capture memory, measurement repeatability, and per-pin architecture. The Inovys FaultInsyte technology provides visualization and diagnostic tools with unique views into the structural DNA of the semiconductor device. The solution can be added to existing V93000 Pin Scale systems.
Verigy