September 2008
Welcome to EE-Evaluation Engineering magazine's monthly e-mail newsletter, providing the latest EE articles, industry news, announcements, and more.
LXI ConneXion |
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Data Acquisition
Whether you’re monitoring a nuclear fusion experiment or carbon exchange high in a rainforest canopy, a large number of instrumentation attributes are involved. We discuss several applications where less important specifications such as isolation and common-mode voltage range are critical.
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DigRF Test
This mobile phone article is all about putting analog on the RFIC rather than the baseband chip. As a result, testing the baseband device can be a completely digital process. Although at today’s 312-Mb/s 3G data rate and >1 Gb/s anticipated for LTE, clock synchronization, protocol-related issues, and the need for fast test analysis contribute several nontrivial technical challenges.
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Boundary Scan
The boundary scan TAP has enhanced capabilities that extend beyond testing logic devices to programming flash memory ICs, debugging microprocessors, and driving external digital I/O modules. Here’s a look at the pitfalls associated with each of these activities and, based on the author’s years of hands-on experience, suggestions to avoid them.
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MEMS
Quartz isn’t dead yet, not by a long shot. But for less demanding applications, oscillators based on MEMS resonators are a tiny and low-cost alternative. Some MEMS-based oscillators can be integrated with CMOS circuitry while others must be separately packaged. However, none of these devices yet is specified with <50-ppm long-term accuracy, a level easily provided in a quartz crystal oscillator.
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Component Reliability
Plastic-packaged ICs are electrically tested so you can be sure they work properly. The question is, for how long? Acoustic microimaging allows internal packaging defects to be analyzed and ICs rejected with types of damage that may lead to long-term failures.
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From an Engineer’s Notebook
You’ve got the EUT, a spectrum analyzer, a current probe, a signal generator, and a copy of MIL-STD 461F ready for some serious EMC testing. Fortunately, this article also is available to guide you through those parts of the specification that can be ambiguous or confusing depending on the exact nature of the tests to be performed.
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LXI/PXI/VXI Buyers Guide
No matter what platform you are working with, whether it is LXI, PXI, or VXI, our annual buyers guide lists the products and the companies that offer them. In the guide, you’ll find arbitrary waveform generators, automated test systems, counters, data acquisition systems, digital I/O, digitizers, DMMs, interconnect systems, oscilloscopes, power supplies/sources, software, and spectrum analyzers. Also included are consultants and system integrators.
View the guide…
Class B Instruments
If you’re aware of LXI but haven’t yet seen much advantage to using the Class C instruments, it’s time to reconsider. Class B products are being introduced that add IEEE 1588 software- and hardware-supported time synchronization, making possible highly accurate peer-to-peer control of measurement timing and event sequencing even between sites thousands of miles apart.
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Conformance Testing
As a user, you want any group of LXI instruments to interoperate correctly so you can simply build your test system. Conformance testing during Plugfests ensures that and is a very efficient way for a manufacturer to ensure new product compliance and gain expert help and advice if required.
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