February 2012 Features
The Progression of MIL/Aero Test Systems
By Tom Lecklider, Senior Technical Editor, February 2012
This article describes the current state of DoD testers as well as several PXI-based initiatives that promise smaller size, lower power, and less cost....
Wi-Fi Extends the Reach of Data Acquisition
By Rick Nelson, Executive Editor, February 2012
Today’s wireless DAQ systems provide the bandwidth necessary to provide DAQ functionality in applications areas ranging from monitoring bridges to collecting data in HVAC systems....
Ultrasound Imaging: More Than Skin-Deep
By Tom Lecklider, Senior Technical Editor, February 2012
Today’s portable ultrasound machines use a huge amount of signal processing and advanced technology to provide 2-D, 3-D, and 4-D images....
Powering Test
By Tom Lecklider, Senior Technical Editor, February 2012
The second installment of our continuing “50 Years of Test Technology” series discusses how power supplies, sources, and loads have been covered during EE’s first 50 years of publication....
Addressing Interposer and TSV Quality Challenges
By Rick Nelson, Executive Editor, February 2012
Test equipment dedicated to testing 3-D devices is in the planning stages as details of 3-D IC production get worked out....
Instruments Speed Compliance Tests
By Rick Nelson, Executive Editor, February 2012
Formal certification can take place in a laboratory dedicated to the task, but product developers themselves can speed the approval process....
Editorial: Paper Forever, But Less of It
By Rick Nelson, Executive Editor, February 2012
A polling organization looks at the prospects for paper in the age of mobile devices, e-book readers, smartphones, and tablets....
February Products
By Evaluation Engineering, February 2012
February Products...
By Tom Lecklider, Senior Technical Editor, February 2012